502 search results - page 26 / 101 » Test pattern generation based on arithmetic operations |
101
Voted
DDECS
2008
IEEE
15 years 8 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
121
Voted
DAC
2000
ACM
16 years 2 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
117
click to vote
VLSID
2005
IEEE
16 years 2 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
CORR
2010
Springer
15 years 2 months ago
2010
Springer
Considerable research has taken place in recent times in the area of parameterization of software defined radio (SDR) architecture. Parameterization decreases the size of the soft...
ICWS
2010
IEEE
15 years 3 months ago
2010
IEEE
This paper addresses one of the major problems of SOA software development: the lack of support for testing complex service-oriented systems. The research community has developed v...