502 search results - page 28 / 101 » Test pattern generation based on arithmetic operations |
104
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ITC
2000
IEEE
15 years 6 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
104
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ICRA
2010
IEEE
15 years 12 days ago
2010
IEEE
— We present here an original approach to test the feasibility of footsteps for a given walking pattern generator. It is based on a new approximation algorithm intended to cope w...
124
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SYNASC
2005
IEEE
15 years 7 months ago
2005
IEEE
— Systolic online algorithms for the multiplication of univariate polynomials and of multiple precision integers are synthesised using a novel method based on the following funct...
96
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ICMCS
2005
IEEE
15 years 7 months ago
2005
IEEE
In this research, an architecture that performs both forward and inverse lifting-based discrete wavelet transform is proposed. The proposed architecture reduces the hardware requi...
SPLC
2007
15 years 3 months ago
2007
Early generation software product line (SPL) methodologies tended to be large, complex, and offer many options and choices, making adoption in practice difficult to comprehend, ju...