502 search results - page 2 / 101 » Test pattern generation based on arithmetic operations |
ISQED
2007
IEEE
14 years 16 days ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
DAC
1999
ACM
14 years 7 months ago
1999
ACM
IFIP
2001
Springer
13 years 10 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
IACR
2011
12 years 5 months ago
2011
In this paper, we study the complexity of secure multiparty computation using only the secure arithmetic black-box of a finite field, counting the cost by the number of secure m...
VLSID
2002
IEEE
14 years 6 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...