502 search results - page 2 / 101 » Test pattern generation based on arithmetic operations |
89
Voted
ISQED
2007
IEEE
15 years 6 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
DAC
1999
ACM
16 years 19 days ago
1999
ACM
131
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IFIP
2001
Springer
15 years 4 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
IACR
2011
13 years 11 months ago
2011
In this paper, we study the complexity of secure multiparty computation using only the secure arithmetic black-box of a finite field, counting the cost by the number of secure m...
VLSID
2002
IEEE
16 years 1 days ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...