502 search results - page 32 / 101 » Test pattern generation based on arithmetic operations |
152
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IEEEAMS
2003
IEEE
15 years 7 months ago
2003
IEEE
Selection of the most suitable nodes on a network to execute a parallel application requires matching the network status to the application requirements. We propose and validate a...
126
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ASPDAC
2009
ACM
15 years 8 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
114
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NIPS
1997
15 years 3 months ago
1997
Up-propagation is an algorithm for inverting and learning neural network generative models. Sensory input is processed by inverting a model that generates patterns from hidden var...
110
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VTS
2007
IEEE
15 years 8 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
ITC
2002
IEEE
15 years 6 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...