502 search results - page 35 / 101 » Test pattern generation based on arithmetic operations |
142
click to vote
DSD
2010
IEEE
15 years 2 months ago
2010
IEEE
— Real-time face recognition by computer systems is required in many commercial and security applications because it is the only way to protect privacy and security in the sea of...
121
click to vote
ICES
2000
Springer
15 years 5 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
115
click to vote
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
Abstract—The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, ev...
164
click to vote
IPPS
1997
IEEE
15 years 6 months ago
1997
IEEE
We present the Data Parallel Fortran (DPF) benchmark suite, a set of data parallel Fortran codes forevaluatingdata parallel compilers appropriatefor any target parallel architectu...
108
click to vote
AGI
2008
15 years 3 months ago
2008
: Consistent with the ultimate goals of AGI, we can expect that deductive consequences of large and grammatically varied text bases would not be generated by sequential application...