502 search results - page 36 / 101 » Test pattern generation based on arithmetic operations |
142
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ISCAS
2007
IEEE
15 years 8 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
126
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MCS
2010
Springer
15 years 10 days ago
2010
Springer
Besides speed and period length, the quality of uniform random number generators is usually assessed by measuring the uniformity of their point sets, formed by taking vectors of s...
142
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INTEGRATION
2006
15 years 1 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
109
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ICSM
2002
IEEE
15 years 6 months ago
2002
IEEE
Design patterns are widely recognized as important software development methods. Their use as software understanding tools, though generally acknowledged has been scarcely explore...
121
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GBRPR
2007
Springer
15 years 8 months ago
2007
Springer
We introduce a method for computing homology groups and their generators of a 2D image, using a hierarchical structure i.e. irregular graph pyramid. Starting from an image, a hiera...