64 search results - page 13 / 13 » Test pattern generation for width compression in BIST |
ITC
1997
IEEE
13 years 10 months ago
1997
IEEE
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
JCIT
2010
13 years 1 months ago
2010
Artificial Neural Networks(ANNS) have top level of capability to progress the estimation of cracks in metal tubes. The aim of this paper is to propose an algorithm to identify mod...
IS
2008
13 years 6 months ago
2008
Implementations that load XML documents and give access to them via, e.g., the DOM, suffer from huge memory demands: the space needed to load an XML document is usually many times...
CIKM
2009
Springer
13 years 11 months ago
2009
Springer
Exact substring matching queries on large data collections can be answered using q-gram indices, that store for each occurring q-byte pattern an (ordered) posting list with the po...