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72
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VLSID
2004
IEEE
135views VLSI» more  VLSID 2004»
15 years 10 months ago
Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
M. S. Gaur, Mark Zwolinski
68
Voted
ITC
1998
IEEE
61views Hardware» more  ITC 1998»
15 years 2 months ago
Test session oriented built-in self-testable data path synthesis
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
Han Bin Kim, Takeshi Takahashi, Dong Sam Ha