624 search results - page 15 / 125 » Test set compaction algorithms for combinational circuits |
74
Voted
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
VCIP
2003
14 years 11 months ago
2003
International recommendations for subjective video quality assessment (e.g., ITU-R BT.500-11) include specifications for how to perform many different types of subjective tests. I...
IDEAL
2003
Springer
15 years 2 months ago
2003
Springer
Mining frequent patterns has been a topic of active research because it is computationally the most expensive step in association rule discovery. In this paper, we discuss the use ...
90
Voted
EURODAC
1994
IEEE
15 years 1 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
90
Voted
EURODAC
1994
IEEE
15 years 1 months ago
1994
IEEE
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...