624 search results - page 17 / 125 » Test set compaction algorithms for combinational circuits |
BIBE
2007
IEEE
15 years 1 months ago
2007
IEEE
Abstract—Gene expression data usually contains a large number of genes, but a small number of samples. Feature selection for gene expression data aims at finding a set of genes ...
ICCAD
1997
IEEE
15 years 3 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
105
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MEMOCODE
2007
IEEE
15 years 6 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
110
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GECCO
2003
Springer
15 years 4 months ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
ICES
2003
Springer
15 years 4 months ago
2003
Springer
In this paper, we show how artificial evolution can be used to improve the fault-tolerance of electronic circuits. We show that evolution is able to improve the fault tolerance of...