624 search results - page 20 / 125 » Test set compaction algorithms for combinational circuits |
130
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COLT
2008
Springer
15 years 5 months ago
2008
Springer
We define a model of learning probabilistic acyclic circuits using value injection queries, in which an arbitrary subset of wires is set to fixed values, and the value on the sing...
116
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ICCAD
1999
IEEE
15 years 8 months ago
1999
IEEE
Available techniques for testing core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesising low-overhead test architectures and compact test solutions....
139
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JAIR
2010
15 years 2 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
144
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ICCAD
1995
IEEE
15 years 7 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
124
Voted
GLVLSI
2007
IEEE
15 years 10 months ago
2007
IEEE
A probabilistic power estimation technique for combinational circuits is presented. A novel set of simple waveforms is the kernel of this technique. The transition density of each...