624 search results - page 21 / 125 » Test set compaction algorithms for combinational circuits |
151
Voted
ISMVL
2008
IEEE
15 years 10 months ago
2008
IEEE
Compact realizations of reversible logic functions are of interest in the design of quantum computers. In this paper we present an exact synthesis algorithm, based on Boolean Sati...
147
Voted
TCAD
2008
15 years 3 months ago
2008
Abstract--Designers and high-level synthesis tools can introduce unwanted cycles in digital circuits, and for certain combinational functions, cyclic circuits that are stable and d...
142
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VLSID
2005
IEEE
15 years 9 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
135
Voted
SDM
2003
SIAM
15 years 5 months ago
2003
SIAM
We study the interaction between global and local techniques in data mining. Specifically, we study the collections of frequent sets in clusters produced by a probabilistic clust...
125
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...