624 search results - page 22 / 125 » Test set compaction algorithms for combinational circuits |
157
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ICST
2010
IEEE
15 years 1 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
139
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ICA
2007
Springer
15 years 7 months ago
2007
Springer
Independent Component Analysis (ICA) is a statistical method for expressing an observed set of random vectors as a linear combination of statistically independent components. This...
128
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GECCO
2005
Springer
15 years 9 months ago
2005
Springer
This paper presents an approach to combine competent crossover and mutation operators via probabilistic model building. Both operators are based on the probabilistic model buildin...
131
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JUCS
2007
15 years 3 months ago
2007
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
117
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ATS
2005
IEEE
15 years 9 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...