624 search results - page 25 / 125 » Test set compaction algorithms for combinational circuits |
140
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ENGL
2008
15 years 4 months ago
2008
Multiple-valued quantum circuits are promising choices for future quantum computing technology, since the multiple-valued quantum system is more compact than the corresponding bina...
125
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ASPDAC
1998
ACM
15 years 8 months ago
1998
ACM
Binary decision diagrams (BDDs) have been shown to be a powerful tool in formal verification. Efficient BDD construction techniques become more important as the complexity of proto...
109
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
115
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VLSID
2002
IEEE
16 years 4 months ago
2002
IEEE
In this paper, we address the problem of power dissipation minimization in combinational circuits implemented using pass transistor logic (PTL). We transform the problem of power ...
118
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COLT
2005
Springer
15 years 9 months ago
2005
Springer
We study the problem of learning a kernel which minimizes a regularization error functional such as that used in regularization networks or support vector machines. We consider thi...