624 search results - page 27 / 125 » Test set compaction algorithms for combinational circuits |
127
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DASFAA
2008
IEEE
15 years 10 months ago
2008
IEEE
Clustering time series is usually limited by the fact that the length of the time series has a significantly negative influence on the runtime. On the other hand, approximative c...
130
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VTS
1999
IEEE
15 years 8 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
128
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ICCAD
1995
IEEE
15 years 7 months ago
1995
IEEE
—A problem in technology mapping is that the quality of the final implementation depends significantly on the initially provided circuit structure. This problem is critical, es...
161
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ECAL
1999
Springer
15 years 8 months ago
1999
Springer
Abstract. This paper is concerned with arti cial evolution of neurocontrollers with adaptive synapses for autonomous mobile robots. The method consists of encoding on the genotype ...
ICRA
2006
IEEE
15 years 10 months ago
2006
IEEE
- In this article, a set membership (SM) identification technique is tailored to detect faults in microelectromechanical systems. The SM-identifier estimates an orthotope which con...