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» Test set compaction algorithms for combinational circuits
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ICCAD
1992
IEEE
148views Hardware» more  ICCAD 1992»
15 years 8 months ago
McPOWER: a Monte Carlo approach to power estimation
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
Richard Burch, Farid N. Najm, Ping Yang, Timothy N...
IV
1999
IEEE
151views Visualization» more  IV 1999»
15 years 8 months ago
Occlusion Culling Using Minimum Occluder Set and Opacity Map
The aim of occlusion culling is to cull away a significant amount of invisible primitives at different viewpoints. We present two algorithms to improve occlusion culling for a hig...
Poon Chun Ho, Wenping Wang
PTS
2007
99views Hardware» more  PTS 2007»
15 years 5 months ago
Testing Input/Output Partial Order Automata
Abstract. We propose an extension of the Finite State Machine framework in distributed systems, using input/output partial order automata (IOPOA). In this model, transitions can be...
Stefan Haar, Claude Jard, Guy-Vincent Jourdan
AHS
2007
IEEE
252views Hardware» more  AHS 2007»
15 years 10 months ago
A Hybrid Engine for the Placement of Domain-Specific Reconfigurable Arrays
Rapid-prototyping of commercial devices and the demanding requirements for flexible hardware in mobile applications have driven the raise of reconfigurable hardware. The adaptatio...
Wing On Fung, Tughrul Arslan, Sami Khawam
ACL
1998
15 years 5 months ago
Compacting the Penn Treebank Grammar
Treebanks, such as the Penn Treebank (PTB), offer a simple approach to obtaining a broad coverage grammar: one can simply read the grammar off the parse trees in the treebank. Whi...
Alexander Krotov, Mark Hepple, Robert J. Gaizauska...