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» Test set compaction algorithms for combinational circuits
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ATS
2000
IEEE
134views Hardware» more  ATS 2000»
15 years 8 months ago
Fsimac: a fault simulator for asynchronous sequential circuits
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
Susmita Sur-Kolay, Marly Roncken, Ken S. Stevens, ...
ASPDAC
2004
ACM
113views Hardware» more  ASPDAC 2004»
15 years 7 months ago
Area-minimal algorithm for LUT-based FPGA technology mapping with duplication-free restriction
- Minimum area is one of the important objectives in technology mapping for lookup table-based FPGAs. It has been proven that the problem is NP-complete. This paper presents a poly...
Chi-Chou Kao, Yen-Tai Lai
CVPR
2011
IEEE
15 years 10 days ago
Graph Embedding Discriminant Analysis on Grassmannian Manifolds for Improved Image Set Matching
A convenient way of dealing with image sets is to represent them as points on Grassmannian manifolds. While several recent studies explored the applicability of discriminant analy...
Mehrtash Harandi, Sareh, Shirazi (National ICT Aus...
155
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EH
1999
IEEE
141views Hardware» more  EH 1999»
15 years 8 months ago
On-Line Evolution of FPGA-Based Circuits: A Case Study on Hash Functions
An evolutionary algorithm is used to evolve a digital circuit which computes a simple hash function mapping a 16bit address space into an 8-bit one. The target technology is FPGA,...
Ernesto Damiani, Andrea Tettamanzi, Valentino Libe...
ISVLSI
2003
IEEE
157views VLSI» more  ISVLSI 2003»
15 years 9 months ago
Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
Shalini Ghosh, Sugato Basu, Nur A. Touba