624 search results - page 41 / 125 » Test set compaction algorithms for combinational circuits |
149
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TVLSI
2010
14 years 10 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
120
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FLAIRS
2004
15 years 5 months ago
2004
This article describes an indirectly encoded evolutionary learning algorithm to train morphological neural networks. The indirect encoding method is an algorithm in which the trai...
167
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EC
2010
15 years 1 months ago
2010
Estimation of distribution algorithms (EDAs) that use marginal product model factorizations have been widely applied to a broad range of, mainly binary, optimization problems. In ...
176
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ICDAR
2003
IEEE
15 years 9 months ago
2003
IEEE
The recognition of script in historical documents requires suitable techniques in order to identify single words. Segmentation of lines and words is a challenging task because lin...
127
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FPGA
1995
ACM
15 years 7 months ago
1995
ACM
This paper presents a methodology for production-time testing of (uncustomized) segmented channel eld programmable gate arrays (FPGAs) such as those manufactured by Actel [1]. Th...