624 search results - page 43 / 125 » Test set compaction algorithms for combinational circuits |
151
Voted
DAC
2007
ACM
15 years 8 months ago
2007
ACM
This paper presents MOJITO, a system which optimizes across thousands of analog circuit topologies simultaneously, and returns a set of sized topologies that collectively provide ...
113
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DFT
1997
IEEE
15 years 8 months ago
1997
IEEE
Crosstalk has become a major issue in VLSI design due to the high frequency, long interconnecting lines and small spacing between interconnects in today's integrated circuits...
115
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ISCAS
2006
IEEE
15 years 10 months ago
2006
IEEE
— The rapid control of sonar-guided vehicles through obstacle fields has been a goal of robotics for decades. How sensory data is represented strongly affects how obstacles and g...
149
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ICSE
2004
IEEE-ACM
16 years 4 months ago
2004
IEEE-ACM
Most research on automated specification-based software testing has focused on the automated generation of test cases. Before a software system can be tested, it must be set up ac...
137
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EMNLP
2010
15 years 2 months ago
2010
Word alignment plays a central role in statistical MT (SMT) since almost all SMT systems extract translation rules from word aligned parallel training data. While most SMT systems...