624 search results - page 44 / 125 » Test set compaction algorithms for combinational circuits |
147
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MICAI
2010
Springer
15 years 2 months ago
2010
Springer
The meaning of such verb-noun combinations as take care, undertake work, pay attention can be generalized as DO what is designated by the noun. Likewise, the meaning of make a deci...
127
Voted
TVLSI
2008
15 years 4 months ago
2008
ion levels. The framework also supports the generation of test constraints, which can be satisfied using a constraint solver to generate tests. A compositional verification approac...
114
Voted
DATE
2003
IEEE
15 years 9 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
149
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EDBT
2009
ACM
15 years 11 months ago
2009
ACM
In recent years, large amount of data modeled by graphs, namely graph data, have been collected in various domains. Efficiently processing queries on graph databases has attracted...
130
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ICCAD
2004
IEEE
16 years 1 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...