624 search results - page 46 / 125 » Test set compaction algorithms for combinational circuits |
124
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ICML
2006
IEEE
16 years 5 months ago
2006
IEEE
Central and subspace clustering methods are at the core of many segmentation problems in computer vision. However, both methods fail to give the correct segmentation in many pract...
131
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ICCAD
1995
IEEE
15 years 7 months ago
1995
IEEE
Pad assignment with signal integrity optimization is very important for high-speed VLSI design. In this paper, an efficient method is proposed to effectively minimize both simulta...
129
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IOLTS
2002
IEEE
15 years 9 months ago
2002
IEEE
The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
134
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CONSTRAINTS
2007
15 years 4 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
136
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FLAIRS
2006
15 years 5 months ago
2006
The world wide web has a wealth of information that is related to almost any text classification task. This paper presents a method for mining the web to improve text classificati...