624 search results - page 48 / 125 » Test set compaction algorithms for combinational circuits |
158
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RSCTC
2004
Springer
15 years 9 months ago
2004
Springer
Abstract. We introduce an automated multi-spectral MRI segmentation technique based on approximate reducts derived from the data mining paradigm of the theory of rough sets. We uti...
144
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QSIC
2003
IEEE
15 years 9 months ago
2003
IEEE
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
135
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ISQED
2007
IEEE
15 years 10 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
152
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IJCAI
2007
15 years 5 months ago
2007
Clustering accuracy of partitional clustering algorithm for categorical data primarily depends upon the choice of initial data points (modes) to instigate the clustering process. ...
142
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ICCAD
2003
IEEE
15 years 9 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...