624 search results - page 57 / 125 » Test set compaction algorithms for combinational circuits |
134
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GLVLSI
2010
IEEE
15 years 9 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
129
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ECCV
2008
Springer
16 years 6 months ago
2008
Springer
This paper presents an approach for modeling landmark sites such as the Statue of Liberty based on large-scale contaminated image collections gathered from the Internet. Our system...
162
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IM
2007
15 years 4 months ago
2007
This paper describes Armil, a meta-search engine that groups the web snippets returned by auxiliary search engines into disjoint labeled clusters. The cluster labels generated by A...
124
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
In this paper, we propose a new linear programming based timing driven placement framework for high performance designs. Our LP framework is mainly net-based, but it takes advanta...
148
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GECCO
2006
Springer
15 years 8 months ago
2006
Springer
This work describes a forward-looking approach for the solution of dynamic (time-changing) problems using evolutionary algorithms. The main idea of the proposed method is to combi...