624 search results - page 75 / 125 » Test set compaction algorithms for combinational circuits |
126
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CIDM
2007
IEEE
15 years 10 months ago
2007
IEEE
−Document clustering has become an increasingly important task in analyzing huge numbers of documents distributed among various sites. The challenging aspect is to analyze this e...
133
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ITC
2000
IEEE
15 years 8 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
132
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CEC
2010
IEEE
15 years 2 months ago
2010
IEEE
Abstract-- We present a case study demonstrating that using the REVAC parameter tuning method we can greatly improve the `world champion' EA (the winner of the CEC2005 competi...
139
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MAM
2007
15 years 4 months ago
2007
A unique method has been developed to scavenge solar energy from monocrystalline solar cells to power wireless router nodes that are used in indoor applications. This method elimi...
139
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ISCAS
2006
IEEE
15 years 10 months ago
2006
IEEE
A robust system architecture to achieve optical coherency free optimization. Several methods that had been proposed in the in multiple-beam free-space laser communication links wit...