624 search results - page 77 / 125 » Test set compaction algorithms for combinational circuits |
153
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ICCAD
2009
IEEE
15 years 2 months ago
2009
IEEE
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...
129
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ICDAR
2009
IEEE
15 years 11 months ago
2009
IEEE
The recognition of handwritten characters, words, and text arouses great interest today. To develop the best working system is subject of many papers published. With this paper, m...
154
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SMA
2008
ACM
15 years 4 months ago
2008
ACM
We present an interactive algorithm for continuous collision detection between deformable models. We introduce two techniques to improve the culling efficiency and reduce the numb...
126
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DAC
2002
ACM
16 years 5 months ago
2002
ACM
The next generation of computer chips will continue the trend for more complexity than their predecessors. Many of them will contain different chip technologies and are termed SoC...
171
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EMNLP
2007
15 years 5 months ago
2007
We describe a two-stage optimization of the MaltParser system for the ten languages in the multilingual track of the CoNLL 2007 shared task on dependency parsing. The first stage...