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» Test set compaction algorithms for combinational circuits
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ICML
2007
IEEE
16 years 5 months ago
Full regularization path for sparse principal component analysis
Given a sample covariance matrix, we examine the problem of maximizing the variance explained by a particular linear combination of the input variables while constraining the numb...
Alexandre d'Aspremont, Francis R. Bach, Laurent El...
JCO
2011
115views more  JCO 2011»
14 years 11 months ago
Approximation scheme for restricted discrete gate sizing targeting delay minimization
Discrete gate sizing is a critical optimization in VLSI circuit design. Given a set of available gate sizes, discrete gate sizing problem asks to assign a size to each gate such th...
Chen Liao, Shiyan Hu
DAC
2006
ACM
15 years 10 months ago
Automated design of pin-constrained digital microfluidic arrays for lab-on-a-chip applications*
Microfluidics-based biochips, also referred to as lab-on-a-chip (LoC), are devices that integrate fluid-handling functions such as sample preparation, analysis, separation, and de...
William L. Hwang, Fei Su, Krishnendu Chakrabarty
SBCCI
2005
ACM
111views VLSI» more  SBCCI 2005»
15 years 9 months ago
Total leakage power optimization with improved mixed gates
Gate oxide tunneling current Igate and sub-threshold current Isub dominate the leakage of designs. The latter depends on threshold voltage Vth while Igate vary with the thickness ...
Frank Sill, Frank Grassert, Dirk Timmermann
CVPR
2001
IEEE
16 years 6 months ago
3D Object Recognition from Range Images using Local Feature Histograms
This paper explores a view-based approach to recognize free-form objects in range images. We are using a set of local features that are easy to calculate and robust to partial occ...
Bastian Leibe, Bernt Schiele, Günter Hetzel, ...