840 search results - page 36 / 168 » Test suite oscillations |
93
Voted
ISSRE
2008
IEEE
15 years 6 months ago
2008
IEEE
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
ICCAD
1997
IEEE
15 years 4 months ago
1997
IEEE
We describe a highly accurate but e cient fault simulator for interconnect opens, based on characterizing the standard cell library with SPICE; using transistor charge equations f...
95
Voted
STTT
2008
15 years 10 days ago
2008
Abstract Experience with the development and maintenance of large test suites specified using the Testing and Test Control Notation (TTCN-3) has shown that it is difficult to const...
97
Voted
DATE
2009
IEEE
15 years 7 months ago
2009
IEEE
—The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space ...
109
Voted
ICST
2010
IEEE
14 years 11 months ago
2010
IEEE
—When a program is modified during software evolution, developers typically run the new version of the program against its existing test suite to validate that the changes made ...