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102
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ISCAS
2011
IEEE
210views Hardware» more  ISCAS 2011»
14 years 4 months ago
A mostly-digital analog scan-out chain for low bandwidth voltage measurement for analog IP test
—A method of precise measurement of on-chip analog voltages in a mostly-digital manner, with minimal overhead, is presented. A pair of clock signals is routed to the node of an a...
Rajath Vasudevamurthy, Pratap Kumar Das, Bharadwaj...
137
Voted
JIPS
2010
160views more  JIPS 2010»
14 years 7 months ago
A Regression Test Selection and Prioritization Technique
Regression testing is a very costly process performed primarily as a software maintenance activity. It is the process of retesting the modified parts of the software and ensuring t...
Ruchika Malhotra, Arvinder Kaur, Yogesh Singh
90
Voted
ICSE
2009
IEEE-ACM
15 years 7 months ago
MINTS: A general framework and tool for supporting test-suite minimization
Regression test suites tend to grow over time as new test cases are added to exercise new functionality or to target newly-discovered faults. When test suites become too large, th...
Hwa-You Hsu, Alessandro Orso
ARC
2010
Springer
178views Hardware» more  ARC 2010»
15 years 7 months ago
An Analysis of Delay Based PUF Implementations on FPGA
Physical Unclonable Functions promise cheap, efficient, and secure identification and authentication of devices. In FPGA devices, PUFs may be instantiated directly from FPGA fabri...
Sergey Morozov, Abhranil Maiti, Patrick Schaumont
92
Voted
ECAL
2005
Springer
15 years 6 months ago
Co-evolution of Structures and Controllers for Neubot Underwater Modular Robots
Abstract. This article presents the first results of a project in underwater modular robotics, called Neubots. The goals of the projects are to explore, following Von Neumann’s ...
Barthélémy von Haller, Auke Jan Ijsp...