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GLVLSI
2006
IEEE
101views VLSI» more  GLVLSI 2006»
15 years 6 months ago
Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...
132
Voted
TSE
2002
140views more  TSE 2002»
15 years 3 days ago
Test Case Prioritization: A Family of Empirical Studies
To reduce the cost of regression testing, software testers may prioritize their test cases so that those which are more important, by some measure, are run earlier in the regressi...
Sebastian G. Elbaum, Alexey G. Malishevsky, Gregg ...
91
Voted
ICSM
2006
IEEE
15 years 6 months ago
Using the Case-Based Ranking Methodology for Test Case Prioritization
The test case execution order affects the time at which the objectives of testing are met. If the objective is fault detection, an inappropriate execution order might reveal most ...
Paolo Tonella, Paolo Avesani, Angelo Susi
77
Voted
ISBI
2006
IEEE
16 years 1 months ago
Variance controlled shear stiffness images for MRE data
In the Magnetic Resonance Elastography experiment we consider a harmonically oscillating mechanical force applied to the boundary surface of a phantom and synchronized with the mo...
Joyce R. McLaughlin, Daniel Renzi, Jeong-Rock Yoon...
106
Voted
ASPDAC
2006
ACM
122views Hardware» more  ASPDAC 2006»
15 years 6 months ago
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, ...