8 search results - page 2 / 2 » Test-Pattern Grading and Pattern Selection for Small-Delay D... |
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
ATS
2009
IEEE
14 years 1 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
ET
2010
13 years 5 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...