In this paper, we address a generalized method of mapping a control system simulation model to the PLC emulator being tested using model variables and PLC tags under the offline c...
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
A. J. van de Goor, Georgi Gaydadjiev, Said Hamdiou...
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
—The security assessment of the ICT components of critical infrastructures is nowadays a prominent problem. Risk assessment methodologies require, in order to be effective, to be...