283 search results - page 17 / 57 » Testing CPU emulators |
84
Voted
ITC
1991
IEEE
15 years 4 months ago
1991
IEEE
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
GLVLSI
2007
IEEE
15 years 7 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
149
Voted
GLVLSI
2009
IEEE
14 years 10 months ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...
109
click to vote
VLSID
2007
IEEE
16 years 1 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
83
Voted
ITC
1997
IEEE
15 years 4 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...