244 search results - page 15 / 49 » Testing Digital Circuits with Constraints |
103
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ISCAS
2006
IEEE
15 years 5 months ago
2006
IEEE
—This paper introduces a technique to measure and adjust the relative phase of on-chip high speed digital signals using a random sampling technique of inferential statistics. The...
118
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ITC
1994
IEEE
15 years 3 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
101
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ICCAD
1994
IEEE
15 years 3 months ago
1994
IEEE
A simple extension of the critical path method is presented which allows more accurate optimization of circuits with level-sensitive latches. The extended formulation provides a s...
DATE
2003
IEEE
15 years 5 months ago
2003
IEEE
We present a high-level synthesis algorithm solving the combined scheduling, allocation and binding problem minimizing area under both latency and maximum power per clock-cycle co...
EH
2003
IEEE
15 years 5 months ago
2003
IEEE
This paper describes a multi-objective Evolutionary Algorithm (EA) system for the synthesis of efficient non-linear VLSI circuit modules. The EA takes the specification for a no...