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VTS
2003
IEEE
119views Hardware» more  VTS 2003»
15 years 3 months ago
Test Data Compression Using Dictionaries with Fixed-Length Indices
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
Lei Li, Krishnendu Chakrabarty
ITC
1993
IEEE
148views Hardware» more  ITC 1993»
15 years 2 months ago
DELTEST: Deterministic Test Generation for Gate-Delay Faults
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
Udo Mahlstedt
APPROX
2009
Springer
137views Algorithms» more  APPROX 2009»
15 years 4 months ago
Testing Computability by Width Two OBDDs
Property testing is concerned with deciding whether an object (e.g. a graph or a function) has a certain property or is “far” (for some definition of far) from every object w...
Dana Ron, Gilad Tsur
ATS
2003
IEEE
131views Hardware» more  ATS 2003»
15 years 3 months ago
Software-Based Delay Fault Testing of Processor Cores
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hi...
ICSE
2007
IEEE-ACM
15 years 10 months ago
Regression Test Selection for AspectJ Software
As aspect-oriented software development gains popularity, there is growing interest in using aspects to implement cross-cutting concerns in object-oriented systems. When aspect-or...
Guoqing Xu, Atanas Rountev