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ICCAD
2002
IEEE
85views Hardware» more  ICCAD 2002»
15 years 6 months ago
On undetectable faults in partial scan circuits
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
Irith Pomeranz, Sudhakar M. Reddy
NIPS
2007
15 years 3 months ago
Sequential Hypothesis Testing under Stochastic Deadlines
Most models of decision-making in neuroscience assume an infinite horizon, which yields an optimal solution that integrates evidence up to a fixed decision threshold; however, u...
Peter Frazier, Angela Yu
GECCO
2005
Springer
100views Optimization» more  GECCO 2005»
15 years 7 months ago
The MaxSolve algorithm for coevolution
Coevolution can be used to adaptively choose the tests used for evaluating candidate solutions. A long-standing question is how this dynamic setup may be organized to yield reliab...
Edwin D. de Jong
CVPR
2008
IEEE
16 years 3 months ago
Order consistent change detection via fast statistical significance testing
Robustness to illumination variations is a key requirement for the problem of change detection which in turn is a fundamental building block for many visual surveillance applicati...
Maneesh Singh, Vasu Parameswaran, Visvanathan Rame...
STOC
2003
ACM
102views Algorithms» more  STOC 2003»
16 years 2 months ago
Some 3CNF properties are hard to test
For a Boolean formula on n variables, the associated property P is the collection of n-bit strings that satisfy . We study the query complexity of tests that distinguish (with hig...
Eli Ben-Sasson, Prahladh Harsha, Sofya Raskhodniko...