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ITC
1991
IEEE
86views Hardware» more  ITC 1991»
15 years 8 months ago
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
F. Joel Ferguson, Tracy Larrabee
INFSOF
2007
104views more  INFSOF 2007»
15 years 5 months ago
A state-based approach to integration testing based on UML models
: Correct functioning of object-oriented software depends upon the successful integration of classes. While individual classes may function correctly, several new faults can arise ...
Shaukat Ali, Lionel C. Briand, Muhammad Jaffar-Ur ...
SSIRI
2010
15 years 3 months ago
A Formal Framework for Mutation Testing
— Model-based approaches, especially based on directed graphs (DG), are becoming popular for mutation testing as they enable definition of simple, nevertheless powerful, mutation...
Fevzi Belli, Mutlu Beyazit
CORR
2010
Springer
152views Education» more  CORR 2010»
15 years 2 months ago
Evolutionary Approach to Test Generation for Functional BIST
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, Raim...
ICSE
2011
IEEE-ACM
14 years 8 months ago
ReAssert: a tool for repairing broken unit tests
Successful software systems continuously change their requirements and thus code. When this happens, some existing tests get broken because they no longer reflect the intended be...
Brett Daniel, Danny Dig, Tihomir Gvero, Vilas Jaga...