7766 search results - page 227 / 1554 » Testing Nondeterminate Systems |
164
Voted
KBSE
2008
IEEE
16 years 16 days ago
2008
IEEE
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
166
Voted
APSEC
2006
IEEE
16 years 6 days ago
2006
IEEE
Testing for time-related behaviors of PLC software is important and should be performed carefully. We propose a structural testing technique on Function Block Diagram(FBD) network...
139
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DATE
2006
IEEE
16 years 6 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
167
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QSIC
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
144
Voted
VLSID
2000
IEEE
15 years 10 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...