7766 search results - page 237 / 1554 » Testing Nondeterminate Systems |
183
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TRIDENTCOM
2005
IEEE
15 years 12 months ago
2005
IEEE
Wireless mesh networks have increasingly become an object of interest in recent years as a strong alternative to purely wired infrastructure networks and purely mobile wireless ne...
159
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DFT
2003
IEEE
15 years 11 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
176
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
168
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HIS
2004
15 years 7 months ago
2004
With inspiration from psychophysical researches of the human visual system we propose a novel method for performance evaluation of contour based shape recognition algorithms. We u...
176
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CORR
2010
Springer
15 years 6 months ago
2010
Springer
Testing is a vital part of the software development process. Test Case Generation (TCG) is the process of automatically generating a collection of test-cases which are applied to ...