1610 search results - page 115 / 322 » Testing Patterns |
101
Voted
DDECS
2007
IEEE
15 years 9 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
106
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ISMVL
2007
IEEE
15 years 8 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
100
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DAC
2000
ACM
15 years 7 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
129
Voted
DAC
2002
ACM
16 years 3 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
113
Voted
EDBT
2008
ACM
15 years 4 months ago
2008
ACM
New graph structures where node labels are members of hierarchically organized ontologies or taxonomies have become commonplace in different domains, e.g., life sciences. It is a ...