1610 search results - page 11 / 322 » Testing Patterns |
119
Voted
CP
1998
Springer
15 years 6 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
120
Voted
VLSID
2005
IEEE
15 years 7 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
128
Voted
TC
2008
15 years 1 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
143
click to vote
ATS
2005
IEEE
15 years 7 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
120
Voted
SEW
2007
IEEE
15 years 8 months ago
2007
IEEE
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...