1610 search results - page 132 / 322 » Testing Patterns |
119
Voted
ATS
2004
IEEE
15 years 6 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...
106
Voted
AAAI
2008
15 years 5 months ago
2008
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...
118
Voted
ET
2010
15 years 1 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
138
Voted
EURODAC
1994
IEEE
15 years 6 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
121
Voted
CHI
2010
ACM
15 years 9 months ago
2010
ACM
Cooperative design has been an integral part of many games. With the success of games like Left4Dead, many game designers and producers are currently exploring the addition of coo...