1610 search results - page 134 / 322 » Testing Patterns |
121
Voted
PR
2000
15 years 2 months ago
2000
An expert system for analysis and recognition of general symbols is introduced. The system uses the structural pattern recognition technique for modeling symbols by a set of strai...
102
Voted
ITC
2003
IEEE
15 years 8 months ago
2003
IEEE
We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...
138
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VTS
2003
IEEE
15 years 8 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
96
Voted
ICCAD
2000
IEEE
15 years 7 months ago
2000
IEEE
The Charge Sharing (CS) problem is one of notorious noise problems in domino circuits design and test. In this paper, this problem is thoroughly investigated by considering circui...
121
Voted
NAACL
2003
15 years 4 months ago
2003
The development of FrameNet, a large database of semantically annotated sentences, has primed research into statistical methods for semantic tagging. We advance previous work by a...