1610 search results - page 135 / 322 » Testing Patterns |
101
Voted
DAC
2001
ACM
16 years 3 months ago
2001
ACM
We propose a new BDD-based method for decomposition of multi-output incompletely specified logic functions into netlists of two-input logic gates. The algorithm uses the internal ...
127
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ISQED
2007
IEEE
15 years 9 months ago
2007
IEEE
Novel experimental characterization method and circuit modeling for frequency-variant transmission lines are presented. Experimental test patterns are designed and fabricated by u...
120
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ASPDAC
2005
ACM
15 years 4 months ago
2005
ACM
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
127
Voted
ICSE
2008
IEEE-ACM
16 years 3 months ago
2008
IEEE-ACM
Dynamically discovering likely program invariants from concrete test executions has emerged as a highly promising software engineering technique. Dynamic invariant inference has t...
108
Voted
CIDM
2007
IEEE
15 years 9 months ago
2007
IEEE
— There are several types of processes which can be modeled explicitly by recording the interactions between a set of actors over time. In such applications, a common objective i...