1610 search results - page 164 / 322 » Testing Patterns |
102
Voted
DSD
2007
IEEE
15 years 9 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
117
Voted
VTS
2005
IEEE
15 years 8 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
106
Voted
DATE
2003
IEEE
15 years 8 months ago
2003
IEEE
We propose a new approach to accelerate transaction level verification by raising the productivity of the verification suites including test patterns, protocol checker, and simula...
115
Voted
EURODAC
1994
IEEE
15 years 7 months ago
1994
IEEE
Symbolic state space exploration techniques for Finite State Machines (FSMs) are a major recent result in CAD for VLSI. Most of them are exact and based on forward traversal, but ...
124
Voted
ASPDAC
2001
ACM
15 years 6 months ago
2001
ACM
Ethernet communication devices, such as adapter, hub, bridge and switch, all follow IEEE 802.3 standard protocol. We have designed and implemented an integrated 10/100 Mbps Etherne...