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98
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ET
2000
80views more  ET 2000»
15 years 2 months ago
A New Method for Testing Re-Programmable PLAs
: We present a method for obtaining a minimal set of test configurations and their associated set oftest patterns that completely tests re-programmable Programmable Logic Arrays (P...
Charles E. Stroud, James R. Bailey, Johan R. Emmer...
ICIAP
1997
ACM
15 years 6 months ago
Unsupervised Texture Segmentation Using Feature Distributions
This paper presents an unsupervised texture segmentation method, which uses distributions of local binary patterns and pattern contrasts for measuring the similarity of adjacent i...
Timo Ojala, Matti Pietikäinen
108
Voted
KBSE
2008
IEEE
15 years 8 months ago
Exploring the composition of unit test suites
In agile software development, test code can considerably contribute to the overall source code size. Being a valuable asset both in terms of verification and documentation, the ...
Bart Van Rompaey, Serge Demeyer
134
Voted
JFP
2006
113views more  JFP 2006»
15 years 2 months ago
Efficient manipulation of binary data using pattern matching
Pattern matching is an important operation in functional programs. So far, pattern matching has been investigated in the context of structured terms. This article presents an appr...
Per Gustafsson, Konstantinos F. Sagonas
ARVLSI
1995
IEEE
78views VLSI» more  ARVLSI 1995»
15 years 5 months ago
A technique for high-speed, fine-resolution pattern generation and its CMOS implementation
This paper presents an architecture for generating a high-speed data pattern with precise edge placement resolution by using the matched delay technique. The technique involves ...
Gary C. Moyer, Mark Clements, Wentai Liu, Toby Sch...