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KBSE
2008
IEEE
15 years 11 months ago
Random Test Run Length and Effectiveness
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
IJNSEC
2010
98views more  IJNSEC 2010»
14 years 11 months ago
A Random Bit Generator Using Chaotic Maps
Chaotic systems have many interesting features such as sensitivity on initial condition and system parameter, ergodicity and mixing properties. In this paper, we exploit these int...
Narendra K. Pareek, Vinod Patidar, Krishan K. Sud
KBSE
2007
IEEE
15 years 10 months ago
A framework and tool supports for testing modularity of software design
Modularity is one of the most important properties of a software design, with significant impact on changeability and evolvability. However, a formalized and automated approach i...
Yuanfang Cai, Sunny Huynh, Tao Xie
DSD
2006
IEEE
93views Hardware» more  DSD 2006»
15 years 10 months ago
High-Level Decision Diagram based Fault Models for Targeting FSMs
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
Jaan Raik, Raimund Ubar, Taavi Viilukas
IJAR
2006
92views more  IJAR 2006»
15 years 4 months ago
Possibilistic clustering approach to trackless ring Pattern Recognition in RICH counters
The pattern recognition problem in Ring Imaging CHerenkov (RICH) counters concerns the identification of an unknown number of rings whose centers and radii are assumed to be unkno...
A. M. Massone, Léonard Studer, Francesco Ma...