1610 search results - page 93 / 322 » Testing Patterns |
124
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SDM
2009
SIAM
15 years 11 months ago
2009
SIAM
In this paper, we study efficient closed pattern mining in a general framework of set systems, which are families of subsets ordered by set-inclusion with a certain structure, pro...
154
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ISCAS
2007
IEEE
15 years 8 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
113
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DDECS
2006
IEEE
15 years 8 months ago
2006
IEEE
- Extension of a BIST design algorithm is proposed in this paper. The method is based on a synthesis of a combinational block - the decoder, transforming pseudo-random code words i...
107
Voted
DATE
1997
IEEE
15 years 6 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
137
Voted
ICML
2006
IEEE
16 years 3 months ago
2006
IEEE
We investigate the problem of learning to predict moves in the board game of Go from game records of expert players. In particular, we obtain a probability distribution over legal...