N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D...
In this paper we present a distributed Hardware-in-the-Loop (HiL) simulation approach that supports the verification and validation activities in an integrated architecture as rec...
Martin Schlager, Roman Obermaisser, Wilfried Elmen...
This paper is about the elicitation of the requirements for an intelligent interface for a software test development environment that will accommodate the physically challenged (P...
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
With the development of modern electronic and computer technologies, sports training and competition became more and more technical. A great deal of data were recorded, including ...