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DFT
1997
IEEE
108views VLSI» more  DFT 1997»
15 years 1 months ago
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
EAGC
2004
Springer
15 years 3 months ago
Debugging MPI Grid Applications Using Net-dbx
Problem solving using grid computing environments has become very popular amongst research groups in computation-demanding fields. This is due to the ability of Grid technologies a...
Panayiotis Neophytou, Neophytos Neophytou, Paraske...
DIMVA
2010
14 years 11 months ago
Why Johnny Can't Pentest: An Analysis of Black-Box Web Vulnerability Scanners
Black-box web vulnerability scanners are a class of tools that can be used to identify security issues in web applications. These tools are often marketed as "point-and-click ...
Adam Doupé, Marco Cova, Giovanni Vigna
JSW
2007
156views more  JSW 2007»
14 years 9 months ago
An Automatic Test Case Generation Framework for Web Services
— BPEL (Business Process Execution Language) as a de-facto standard for web service orchestration has drawn particularly attention from researchers and industries. BPEL is a semi...
Yongyan Zheng, Jiong Zhou, Paul Krause
CAISE
2009
Springer
15 years 4 months ago
The Declarative Approach to Business Process Execution: An Empirical Test
Declarative approaches have been proposed to counter the limited flexibility of the traditional imperative modeling paradigm, but little empirical insights are available into thei...
Barbara Weber, Hajo A. Reijers, Stefan Zugal, Wern...