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» Testing Reactive Probabilistic Processes
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VLSID
2007
IEEE
131views VLSI» more  VLSID 2007»
15 years 10 months ago
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit C...
CCS
1998
ACM
15 years 2 months ago
A Probabilistic Poly-Time Framework for Protocol Analysis
We develop a framework for analyzing security protocols in which protocol adversaries may be arbitrary probabilistic polynomial-time processes. In this framework, protocols are wr...
Patrick Lincoln, John C. Mitchell, Mark Mitchell, ...
FOSSACS
2003
Springer
15 years 3 months ago
An Intrinsic Characterization of Approximate Probabilistic Bisimilarity
In previous work we have investigated a notion of approximate bisimilarity for labelled Markov processes. We argued that such a notion is more realistic and more feasible to compu...
Franck van Breugel, Michael W. Mislove, Joël ...
ECCV
2002
Springer
15 years 12 months ago
Exemplar-Based Face Recognition from Video
Abstract. A new exemplar-based probabilistic approach for face recognition in video sequences is presented. The approach has two stages: First, Exemplars, which are selected repres...
Shaohua Kevin Zhou, Volker Krüger
INFOCOM
2009
IEEE
15 years 4 months ago
Opportunistic Processing and Query of Motion Trajectories in Wireless Sensor Networks
—We study the problem of in-network processing and queries of trajectories of moving targets in a sensor network. The main idea is to exploit the spatial coherence of target traj...
Dengpan Zhou, Jie Gao